看了多层膜型XRF分析晶体的用户又看了
留言询价
虚拟号将180秒后失效
使用微信扫码拨号
Multilayers XS-55 XS-N XS-C XS-B
Multilayers are not natural crystals but artificially produced “layer analyzers. The lattice plane distances d
are produced by applying thin layers of two materials in alternation onto a substrate (Fig. 18). Multilayers
are characterized by high reflectivity and a somewhat reduced resolution. For the analysis of light
elements the multilayer technique presents an almost revolutionary improvement for numerous
applications in comparison to natural crystals with large lattice plane distances.
Fig. 18: Diffraction in the layers of a multilayer crystal
XS-55:
The most commonly used multilayer with a 2d-value of 5.5 nm for analyzing the elements N to Al and Ca
to Br; standard application for measuring the elements F Na and Mg.
暂无数据
多层膜型XRF分析晶体的工作原理介绍？多层膜型XRF分析晶体的使用方法？多层膜型XRF分析晶体多少钱一台？多层膜型XRF分析晶体使用的注意事顸/li>多层膜型XRF分析晶体的说明书有吗＞/li>多层膜型XRF分析晶体的操作规程有吗？多层膜型XRF分析晶体的报价含票含运费吗？多层膜型XRF分析晶体有现货吗＞/li>多层膜型XRF分析晶体包安装吗＞/li>
手机版：
工商已核宝/p>
